The Effects of Transistor Source-to-Gate Bridging Faults in Complex CMOS Gates
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چکیده
A study of the source-to-gate bridging faults at the transistor level in a CMOS circuit is presented in this brief paper. The manifestation of these faults depends on the resistance value of the connection causing the bridging. It has been shown that such faults manifest either as stuck-at or stuck-open faults and can be detected by tests for stuck-at and stuck-open faults generated for the equivalent logic circuit.
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تاریخ انتشار 2006